Memory macro including through-silicon via

ABSTRACT

A memory macro structure includes a first memory array, a second memory array, a cell activation circuit coupled to the first and second memory arrays and positioned between the first and second memory arrays, a control circuit coupled to the cell activation circuit and positioned adjacent to the cell activation circuit, and a through-silicon via (TSV) extending through one of the cell activation circuit or the control circuit.

BACKGROUND

The ongoing trend in miniaturizing integrated circuits (ICs) hasresulted in progressively smaller devices which consume less power, yetprovide more functionality at higher speeds than earlier technologies.Such miniaturization has been achieved through design and manufacturinginnovations tied to increasingly strict specifications.

IC packages are often used for applications in which power isdistributed among one or more IC dies. In some cases, dies are stackedin three-dimensional (3D) arrangements in which power distributionrelies on through-silicon vias (TSVs) in one or more of the stacked ICdies.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isnoted that, in accordance with the standard practice in the industry,various features are not drawn to scale. In fact, the dimensions of thevarious features may be arbitrarily increased or reduced for clarity ofdiscussion.

FIGS. 1A and 1B are diagrams of a memory macro structure, in accordancewith some embodiments.

FIG. 2 is a diagram of a memory macro structure, in accordance with someembodiments.

FIGS. 3A-3C are diagrams of portions of memory macro structures, inaccordance with some embodiments.

FIG. 4 is a diagram of an IC package, in accordance with someembodiments.

FIG. 5 is a flowchart of a method of operating an IC package, inaccordance with some embodiments.

FIG. 6 is a flowchart of a method of manufacturing a memory macrostructure, in accordance with some embodiments.

FIG. 7 is a flowchart of a method of generating an IC layout diagram, inaccordance with some embodiments.

FIGS. 8A-8C are IC layout diagrams, in accordance with some embodiments.

FIG. 9 is a block diagram of an IC layout diagram generation system, inaccordance with some embodiments.

FIG. 10 is a block diagram of an IC manufacturing system, and an ICmanufacturing flow associated therewith, in accordance with someembodiments.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, orexamples, for implementing different features of the provided subjectmatter. Specific examples of components, values, operations, materials,arrangements, or the like, are described below to simplify the presentdisclosure. These are, of course, merely examples and are not intendedto be limiting. Other components, values, operations, materials,arrangements, or the like, are contemplated. For example, the formationof a first feature over or on a second feature in the description thatfollows may include embodiments in which the first and second featuresare formed in direct contact, and may also include embodiments in whichadditional features may be formed between the first and second features,such that the first and second features may not be in direct contact. Inaddition, the present disclosure may repeat reference numerals and/orletters in the various examples. This repetition is for the purpose ofsimplicity and clarity and does not in itself dictate a relationshipbetween the various embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,”“above,” “upper” and the like, may be used herein for ease ofdescription to describe one element or feature's relationship to anotherelement(s) or feature(s) as illustrated in the figures. The spatiallyrelative terms are intended to encompass different orientations of thedevice in use or operation in addition to the orientation depicted inthe figures. The apparatus may be otherwise oriented (rotated 90 degreesor at other orientations) and the spatially relative descriptors usedherein may likewise be interpreted accordingly.

In various embodiments, a memory macro structure includes a TSVextending through the memory macro and spanning front and back sides ofa memory die that includes the memory macro. A power distributionstructure of an IC package including the memory die positioned between alogic die and a substrate is thereby capable of including TSVs thatextend both between and through memory macros. Compared to approachesthat do not include a TSV extending through a memory macro, TSV densityis increased such that resistance and power losses in the powerdistribution structure are decreased for a given memory macro size.

FIGS. 1A and 1B are diagrams of a memory macro structure 100, inaccordance with some embodiments. FIG. 1A depicts a plan view includingX and Y directions, and FIG. 1B depicts a cross-sectional view along aplane A-A′ that includes the X direction and a Z direction.

Memory macro structure 100 includes multiple instances of memory macros100M and TSVs 100T; each instance of TSV 100T spans a front side FS anda back side BS of an IC die 100D, also referred to as memory die 100D insome embodiments. In the embodiment depicted in FIGS. 1A and 1B, eachinstance of memory macro 100M includes two instances of TSV 100Textending through, and electrically isolated from, the instance ofmemory macro 100M, as discussed below. Memory macro structure 100M andIC die 100D are usable as components of an IC package, e.g., an ICpackage 400 discussed below with respect to FIG. 4 .

The numbers, locations, and relative sizes of memory macros 100M andTSVs 100T depicted in FIGS. 1A and 1B are non-limiting examples providedfor the purpose of illustration. In various embodiments, memory macrostructure 100 includes memory macros 100M and TSVs 100T having numbers,locations, and/or relative sizes other than those depicted in FIGS. 1Aand 1B.

A memory macro, e.g., memory macro 100M, is a memory circuit includingat least one array of memory cells configured to store data, and one ormore circuits configured to control data input, output, and storageoperations (details not depicted in FIGS. 1A and 1B). In someembodiments, memory cells of memory macro 100M include staticrandom-access memory (SRAM) cells. In various embodiments, SRAM cellsinclude five-transistor (5T) SRAM cells, six-transistor (6T) SRAM cells,eight-transistor (8T) SRAM cells, nine-transistor (9T) SRAM cells, orSRAM cells having other numbers of transistors. In various embodimentsmemory cells of memory macro 100M include dynamic random-access memory(DRAM) cells, read-only memory (ROM) cells, non-volatile memory (NVM)cells, or other memory cell types capable of storing data.

A TSV, e.g., TSV 100T, is a conductive structure that spans front andback sides of an IC die, e.g., front side FS and back side BS of IC die100D, and is thereby configured to provide a low resistance path throughthe IC die. A TSV includes one or more conductive materials, e.g.,copper, aluminum, tungsten, titanium, and/or other material(s) suitablefor providing a low-resistance path between front and back sides of anIC die. By being configured to provide a low resistance path through theIC die, a TSV is capable of being included in a power distributionstructure of an IC package, e.g., a power distribution structure 400PDSof IC package 400 discussed below with respect to FIG. 4 .

An instance of memory macro 100M including one or more instances of TSV100T extending through the memory macro 100M is also referred to asmemory macro structure 100M. In some embodiments, one or more instancesof memory macro structure 100M includes memory macro structure 200discussed below with respect to FIGS. 2-3C.

In the embodiment depicted in FIGS. 1A and 1B, each instance of memorymacro 100M includes two instances of TSV 100T extending through, andelectrically isolated from, the instance of memory macro 100M. Invarious embodiments, a given instance of memory macro 100M includeszero, one, or greater than two instances of TSV 100T extending through,and electrically isolated from, the instance of memory macro 100M.

In the embodiment depicted in FIGS. 1A and 1B, memory macro structure100, also referred to as memory die structure 100 in some embodiments,includes each of memory macros 100M and TSVs 100T arranged in rows alongthe X direction. The rows of TSVs 100T are positioned both within memorymacros 100M of the rows of memory macros 100M and between adjacent rowsof memory macros 100M. TSVs 100T are centered in memory macros 100M inthe Y direction such that TSVs 100T have a pitch P1 in the Y direction.A pitch P2 in the Y direction of memory macros 100M is thereby twice aslarge as pitch P1.

For a given size of memory macro 100M, by including TSVs 100T havingpitch P1 half as large as pitch P2, memory macro structure 100 includesTSVs 100T having a greater density than densities in approaches that donot include TSVs extending through memory macros. In some embodiments,memory macro structure 100 includes TSVs 100T otherwise arranged toinclude at least one TSV 100T extending through, and electricallyisolated from, at least one memory macro 100M such that a density ofTSVs 100T is greater than densities in approaches that do not includeTSVs extending through memory macros.

In various embodiments, memory macro structure 100 includes TSVs 100Tpositioned other than centered in memory macros 100M in the Y directionand/or positioned between adjacent columns of memory macros 100M insteadof and/or in addition to between adjacent rows of memory macros 100M. Invarious embodiments, memory macro structure 100 includes subsets ofmemory macros 100M, e.g., alternating rows and/or columns, in which afirst subset includes one or more TSVs 100V and a second subset is freefrom including one or more TSVs 100T.

By including at least one TSV 100T extending through, and electricallyisolated from, at least one memory macro 100M such that a density ofTSVs 100T is greater than densities in approaches that do not includeTSVs extending through memory macros, IC die 100D including the at leastone memory macro 100M is capable of being included in an IC package,e.g., IC package 400 discussed below with respect to FIG. 4 , in whichresistance and power losses in the power distribution structure aredecreased for a given memory macro size.

FIG. 2 is a diagram of memory macro structure 200, in accordance withsome embodiments. Memory macro structure 200 is usable as one or moreinstances of memory macro 100M discussed above with respect to FIGS. 1Aand 1B. FIG. 2 depicts a plan view of memory macro structure 200including the X and Y directions discussed above with respect to FIGS.1A and 1B. Each of FIGS. 3A-3C discussed below is a diagram of a portionof memory macro structure 200, in accordance with some embodiments.

Memory macro structure 200 includes a global control circuit 200GCT,global input/output (I/O) circuits 200GIO, local control circuits200LCT, local I/O circuits 200L10, cell activation circuits 200WLD,memory arrays 200A, and TSVs 100T discussed above with respect to FIGS.1A and 1B.

Global control circuit 200GCT is positioned between and electricallycoupled to global I/O circuits 200GIO, and electrically coupled to eachinstance of local control circuit 200LCT. Each instance of local controlcircuit 200LCT is positioned between and electrically coupled to twoinstances of local I/O circuit 200LIO, and positioned between andelectrically coupled to two instances of cell activation circuit 200WLD,also referred to as word line driver 200WLD in some embodiments. Eachinstance of local I/O circuit 200LIO and each instance of activationcircuit 200WLD is positioned between and electrically coupled to twoinstances of memory array 200A. In various embodiments, memory macrostructure 200 includes combinations of one or more of address lines, bitlines, data lines, cell activation lines (also referred to as word linesin some embodiments), and/or signal lines (not shown in FIG. 2 ) wherebyglobal control circuit 200GCT, global I/O circuits 200GIO, local controlcircuits 200LCT, local I/O circuits 200LIO, cell activation circuits200WLD, and memory arrays 200A are electrically coupled to each other asdiscussed.

Memory arrays 200A are arrays of memory cells configured to store dataas discussed above with respect to FIGS. 1A and 1B. Each of globalcontrol circuit 200GCT, global I/O circuits 200GIO, local controlcircuits 200LCT, local I/O circuits 200LIO, and activation circuits200WLD is an IC configured to perform a subset of operations wherebydata are input to, output from, and stored in corresponding instances ofmemory array 200A responsive to various combinations of address, clock,control, and/or data signals (not shown in FIG. 2 ).

Global control circuit 200GCT is configured to generate and receive oneor more of the address, clock, control, and/or data signals configuredto control top-level operation of memory macro structure 200; eachinstance of global [ROM/0 circuit 200G10 is configured to, responsive toone or more of the address, clock, control, and/or data signals, performtop-level I/O operations; each instance of local control circuit 200LCTis configured to, responsive to one or more of the address, clock,control, and/or data signals, control operation of adjacent instances oflocal I/O circuit 200L10 and cell activation circuit 200WLD, therebycontrolling diagonally adjacent instances of memory array 200A; and eachinstance of local I/O circuit 200L10 and cell activation circuit 200WLDis configured to, responsive to one or more of the address, clock,control, and/or data signals, partially control operation of adjacentinstances of memory array 200A.

In the embodiment depicted in FIG. 2 , memory macro structure 200includes a total of two instances of local control circuit 200LCT, eachcorresponding to four diagonally adjacent instances of memory array200A. In various embodiments, memory macro structure 200 includes atotal of one or more than two instances of local control circuit 200LCT,each corresponding to four diagonally adjacent instances of memory array200A. In some embodiments, memory macro structure 200 includes at leastone instance of local control circuit 200LCT corresponding to fewer orgreater than four instances of memory array 200A.

In the embodiment depicted in FIG. 2 , a single instance of TSV 100Textends through, and is electrically isolated from, each of globalcontrol circuit 200GCT, each instance of local control circuit 200LCT,and each instance of cell activation circuit 200WLD. In someembodiments, more than one instance of TSV 100T extends through, and iselectrically isolated from, one or more of global control circuit200GCT, each instance of local control circuit 200LCT, and each instanceof cell activation circuit 200WLD. In some embodiments, one or more ofglobal control circuit 200GCT, each instance of local control circuit200LCT, and each instance of cell activation circuit 200WLD is free fromincluding a TSV 100T.

In some embodiments, one or more instances of TSV 100T extends through,and is electrically isolated from, each of global control circuit 200GCTand each instance of local control circuit 200LCT; and each instance ofcell activation circuit 200WLD is free from including a TSV 100T. Insome embodiments, one or more instances of TSV 100T extends through, andis electrically isolated from, each instance of cell activation circuit200WLD; and each of global control circuit 200GCT and each instance oflocal control circuit 200LCT is free from including a TSV 100T.

In various embodiments, one or more instances of TSV 100T (not shown)extends through, and is electrically isolated from, each of one or moreinstances of global I/O circuit 200GIO, local I/O circuit 200LIO, and/ormemory array 200A.

In each of the embodiments depicted in FIGS. 3A-3C, an instance of cellactivation circuit 200WLD is adjacent to and electrically coupled toeach of two instances of memory array 200A, and an instance of localcontrol circuit 200LCT is adjacent to, e.g., in the positive or negativeX direction, the instance of cell activation circuit 200WLD. Cellactivation circuit 200WLD includes a portion 200WLDA electricallycoupled to the first instance of memory array 200A and a portion 200WLDBelectrically coupled to the second instance of memory array 200A.

In each of the embodiments depicted in FIGS. 3A and 3B, cell activationcircuit 200WLD includes an instance of a dummy area 200D, and aninstance of TSV 100T extends through the instance of dummy area 200D andis thereby electrically isolated from cell activation circuit 200WLD. Insome embodiments, control circuit 200LCT includes an instance of dummyarea 200D and an additional instance of TSV 100T extends through, and iselectrically isolated from, control circuit 200LCT. In the embodimentdepicted in FIG. 3C, control circuit 200LCT includes an instance ofdummy area 200D, and an instance of TSV 100T extends through theinstance of dummy area 200D and is thereby electrically isolated fromcontrol circuit 200LCT, and cell activation circuit 200WLD is free fromincluding a TSV 100T.

In each of the embodiments depicted in FIGS. 3A and 3B, local controlcircuit 200LCT is coupled to portion 200WLDA through a signal bus CTLBAand separately coupled to portion 200WLDB through a signal bus CTLBB.Local control circuit 200LCT is thereby configured to separatelycommunicate a first set of signals CTLA to portion 200WLDA throughsignal bus CTLBA and a second set of signals CTLB to portion 200WLDBthrough signal bus CTLBB.

In some embodiments, each of portions 200WLDA and 200WLDB includes anaddress decoder and each of first set of signals CTLA and second set ofsignals CTLB includes one or more sets of pre-decode signals.

In the embodiment depicted in FIG. 3C, local control circuit 200LCT iscoupled to both of portions 200WLDA and 200WLDB through a single signalbus CTLB, and local control circuit 200LCT is thereby configured tocommunicate a set of signals CTL to both of portions 200WLDA and 200WLDBthrough signal bus CTLB. In some embodiments, each of portions 200WLDAand 200WLDB includes an address decoder and set of signals CTL includesone or more sets of pre-decode signals.

In the embodiment depicted in FIG. 3A, an instance of dummy area 200Dextends across an entirety of cell activation circuit 200WLD such thatportions 200WLDA and 200WLDB are separated by the instance of dummy area200D. In the embodiment depicted in FIG. 3B, an instance of dummy area200D extends across a portion of cell activation circuit 200WLD suchthat portions 200WLDA and 200WLDB share first and second borders (notlabeled) separated by the instance of dummy area 200D.

In some embodiments, an instance of dummy area 200D extends across aportion of cell activation circuit 200WLD such that portions 200WLDA and200WLDB share a single border (not labeled) adjacent to the instance ofdummy area 200D. In some embodiments, cell activation circuit 200WLDincludes one or more additional instances of dummy area 200D (not shown)such that portions 200WLDA and 200WLDB share one or more bordersadjacent to each instance of dummy area 200D.

In the embodiments depicted in FIGS. 3A and 3B a single instance of TSV100T extends through the instance of dummy area 200D in cell activationcircuit 200WLD. In various embodiments, two or more instances of TSV100T extend through the instance of dummy area 200D in cell activationcircuit 200WLD or the instance of dummy area 200D in cell activationcircuit 200WLD is free from including a TSV 100T.

By the configuration discussed above, memory macro structure 200 iscapable of including at least one TSV 100T extending through, andelectrically isolated from, the memory macro structure 200 such that anIC die including memory macro structure 200 is capable of realizing thebenefits discussed above with respect to memory macro structure 100.

FIG. 4 is a diagram of IC package 400, in accordance with someembodiments. FIG. 4 depicts a cross-sectional view of IC package 400including the X and Z directions discussed above with respect to FIGS.1A and 1B. IC package 400 is a non-limiting example of an IC packageincluding at least one instance of IC die 100D in which one or moreinstances of TSV 100T extend through one or more instances of memorymacro 100M as discussed above with respect to FIGS. 1A-3C.

IC package 400 includes a logic die 400L, a substrate 400S, memory dies100D0-100D3 positioned between logic die 400L and substrate 400S, andpower distribution structure 400PDS. Each of memory dies 100D0-100D3 isan instance of IC die 100D including one or more instances of TSV 100Textending through one or more instances of memory macro 100M(representative instances labeled), each discussed above with respect toFIGS. 1A-3C. Power distribution structure 400PDS includes bumpstructures 400B and the instances of TSV 100T, and is thereby configuredto electrically couple logic die 400L to substrate 400S.

Memory die 100D0 is adjacent to logic die 400L; memory dies100D1A-100D1C are aligned along the X direction, and each of memory dies100D1A-100D1C is adjacent to memory die 100DO; memory die 100D2 isadjacent to each of memory dies 100D1A-100D1C; and memory die 100D3 isadjacent to each of memory die 100D2 and substrate 400S. An instance ofTSV 100T is positioned between memory dies 100D0, 100D1A, 100D1B, and100D2, and an instance of TSV 100T is positioned between memory dies100D0, 100D1B, 100D1C, and 100D2.

Logic die 400L, memory dies 100D0, 100D1A, 100D2, and 100D3, andsubstrate 400S are aligned along the Z direction; logic die 400L, memorydies 100D0, 100D1B, 100D2, and 100D3, and substrate 400S are alignedalong the Z direction; and logic die 400L, memory dies 100DO, 100D1C,100D2, and 100D3, and substrate 400S are aligned along the Z direction.

Logic die 400L is an IC chip including one or more IC devices, e.g., oneor a combination of a logic circuit, a signal circuit, or applicationprocessor, a system on an IC (SoIC), a transmitter and/or receiver, anapplication-specific IC (ASIC), a large-scale integration (LSI) or verylarge-scale integration (VLSI) circuit, a voltage or current regulator,or the like.

Substrate 400S is an IC chip or printed circuit board includingconductive segments supported and electrically separated by a pluralityof insulation layers and configured to receive one or more power supplyvoltages and a reference, e.g., ground, voltage, and distribute the oneor more power supply voltages and reference voltage to one or more ofbump structures 400B.

Conductive segments include conductive lines, vias, contact pads, and/orunder-bump metallization (UBM) structures including one or moreconductive materials, e.g., a metal such as copper, aluminum, tungsten,or titanium, polysilicon, or another material capable of providing a lowresistance path. Insulation layers include one or more dielectricmaterials, e.g., silicon dioxide, silicon nitride, or one or more high-kdielectric materials, molding compounds, or other materials capable ofelectrically insulating adjacent conductive segments from each other.

Power distribution structure 400PDS, also referred to as powerdistribution network 400PDS in some embodiments, includes a plurality ofconductive segments supported and electrically separated by a pluralityof insulation layers and arranged in accordance with power deliveryrequirements, e.g., of logic die 400L. In various embodiments, powerdistribution structure 400PDS includes one or a combination of a TSV,e.g., TSV 100T, a through-dielectric via (TDV), a power rail, a superpower rail, a buried power rail, a contact pad, conductive segmentsarranged in a grid or mesh structure, or another arrangement suitablefor distributing power to one or more IC devices.

The plurality of conductive segments are arranged so as to contact logicdie 400L and some or all of the instances of TSV 100T included in someor all of memory dies 100D0-100D3 such that power distribution structure400PDS is configured to electrically couple logic die 400L to substrate400S through the some or all of the instances of TSV 100T and bumpstructures 400B.

Bump structures 400B are conductive structures that overlie and contactportions of substrate 400S, thereby being configured to provideelectrical connections between substrate 400S and some or all of theinstances of TSV 100T included in memory die 100D3. In some embodiments,bump structures 400B include lead. In some embodiments, bump structures400B include lead-free materials such as tin, nickel, gold, silver,copper, or other materials suitable for providing electrical connectionsto external conductive elements.

In some embodiments, bump structures 400B have substantially sphericalshapes. In some embodiments, bump structures 400B are controlledcollapse chip connection (C4) bumps, ball grid array bumps, microbumpsor the like.

In the non-limiting example depicted in FIG. 4 , IC package 400 includessix instances of memory die 100D, memory dies 100D0-100D3, arranged infour rows positioned between logic die 400L and substrate 400S so as toelectrically couple logic die 400L to substrate 400S. In variousembodiments, IC package includes greater or fewer than six instances ofmemory die 100D and/or includes instances of memory die 100D otherwisearranged so as to electrically couple logic die 400L to substrate 400S.In some embodiments, IC package 400 includes a single instance of memorydie 100D positioned between logic die 400L and substrate 400S so as toelectrically couple logic die 400L to substrate 400S.

In the non-limiting example depicted in FIG. 4 , IC package 400 includesmemory dies 100D0-100D3 oriented with front side FS further along the Zdirection than back side BS (representative instance of memory die 100D3labeled). In various embodiments, one or more of memory dies 100D0-100D3has an opposite orientation of back side BS further along the Zdirection than front side FS.

In the non-limiting example depicted in FIG. 4 , IC package 400 includessingle instances of each of logic die 400L and substrate 400S. Invarious embodiments, IC package 400 includes two or more instances ofone or both of logic die 400L or substrate 400S, and the instances ofmemory die 100D are arranged so as to electrically couple each instanceof logic die 400L to each instance of substrate 400S.

In the non-limiting example depicted in FIG. 4 , memory dies 100D0-100D3include a number of instances of memory macro 100M ranging from one tofive. In various embodiments, one or more of memory dies 100D0-100D3 isfree from including an instance of memory macro 100M or includes anumber of instances of memory macro 100M greater than five.

In the non-limiting example depicted in FIG. 4 , the instances of memorymacro 100M include a number of instances of TSV 100T ranging from one tothree. In various embodiments, one or more instances of memory macro100M includes a number of instances of TSV 100T greater than three.

By the configuration discussed above, IC package 400 includes at leastone instance of IC die 100D in which one or more instances of TSV 100Textend through one or more instances of memory macro 100M such that ICpackage 400 is capable of realizing the benefits discussed above withrespect to memory macro 100.

FIG. 5 is a flowchart of a method 500 of operating an IC package, inaccordance with one or more embodiments. Method 500 is usable with an ICpackage, e.g., IC package 400 discussed above with respect to FIG. 4 .

The sequence in which the operations of method 500 are depicted in FIG.5 is for illustration only; the operations of method 500 are capable ofbeing executed in sequences that differ from that depicted in FIG. 5 .In some embodiments, operations in addition to those depicted in FIG. 5are performed before, between, during, and/or after the operationsdepicted in FIG. 5 . In some embodiments, the operations of method 500are part of operating a circuit, e.g., a circuit that includes an ICpackage.

At operation 510, in some embodiments, a power supply voltage isreceived at a first end of a TSV of a memory die. Receiving the powersupply voltage at the first end of the TSV of the memory die includesthe memory die being positioned in an IC package, and receiving thepower supply voltage at the first end of the TSV of the memory dieincludes receiving the power supply voltage from a power distributionstructure of the IC package. In some embodiments, receiving the powersupply voltage at the first end of the TSV of the memory die includesreceiving the power supply voltage from power distribution structure400PDS discussed above with respect to FIG. 4 . In some embodiments,receiving the power supply voltage from the power distribution structureincludes receiving the power supply voltage from a bump structure, e.g.,a bump structure 400B discussed above with respect to FIG. 4 .

In some embodiments, the memory die is positioned between a logic dieand a substrate configured to receive the power supply voltage, andreceiving the power supply voltage at the first end of the TSV of thememory die includes receiving the power supply voltage at the substrate.In some embodiments, receiving the power supply voltage at the substrateincludes receiving the power supply voltage at substrate 400S of ICpackage 400 discussed above with respect to FIG. 4 .

In some embodiments, receiving the power supply voltage at the first endof the TSV of the memory die includes receiving the power supply voltageat an end of TSV 100T of memory die 100D discussed above with respect toFIGS. 1A-4 .

In some embodiments, the TSV is one TSV of a plurality of TSVs, andreceiving the power supply voltage at the first end of the TSV includesreceiving the power supply voltage at each TSV of the plurality of TSVs,e.g., multiple instances of TSV 100T discussed above with respect toFIGS. 1A-4 .

In some embodiments, the memory die is one memory die of a plurality ofmemory dies, and receiving the power supply voltage at the first end ofthe TSV of the memory die includes receiving the power supply voltagetranslated through one or more additional memory dies of the pluralityof memory dies.

In some embodiments, receiving the power supply voltage at the first endof the TSV of the memory die includes receiving a reference, e.g.,ground voltage.

At operation 520, the power supply voltage is translated through amemory macro to a second end of the TSV. Translating the power supplyvoltage through the memory macro includes translating the power supplyvoltage electrically isolated from the memory macro. In someembodiments, translating the power supply voltage through the memorymacro includes translating the power supply voltage through memory macro100 discussed above with respect to FIGS. 1A-4 .

In some embodiments, translating the power supply voltage through thememory macro includes translating the power supply voltage through acontrol circuit or cell activation circuit of the memory macro, e.g.,global control circuit 200GCT, local control circuit 200LCT, or cellactivation circuit 200WLD discussed above with respect to FIGS. 2-3C.

In some embodiments, the TSV is one TSV of a plurality of TSVs includedin the memory macro, and translating the power supply voltage throughthe memory macro includes translating the power supply voltage to secondends of each TSV of the plurality of TSVs, e.g., multiple instances ofTSV 100T discussed above with respect to FIGS. 1A-4 .

In some embodiments, the memory macro is one memory macro of a pluralityof memory macros, and translating the power supply voltage through thememory macro includes translating the power supply voltage through eachmemory macro of the plurality of memory macros, e.g., multiple instancesof memory macro 100M discussed above with respect to FIGS. 1A-4 .

In some embodiments, translating the power supply voltage through thememory macro includes translating the reference voltage through thememory macro.

At operation 530, the power supply voltage is received at the logic diefrom the second end of the TSV. Receiving the power supply voltage atthe logic die includes receiving the power supply voltage from the powerdistribution structure of the IC package, e.g., power distributionstructure 400PDS of IC package 400 discussed above with respect to FIG.4 .

In some embodiments, the memory die is one memory die of a plurality ofmemory dies, and receiving the power supply voltage from the second endof the TSV includes receiving the power supply voltage translatedthrough one or more additional memory dies of the plurality of memorydies.

In some embodiments, the TSV is one TSV of a plurality of TSVs, andreceiving the power supply voltage from the second end of the TSVincludes receiving the power supply voltage from the second end of eachTSV of the plurality of TSVs, e.g., multiple instances of TSV 100Tdiscussed above with respect to FIGS. 1A-4 .

In some embodiments, receiving the power supply voltage from the secondend of the TSV includes receiving the reference voltage from the secondend of the TSV.

By executing some or all of the operations of method 500, IC packageoperation includes translating a power supply voltage through a memorymacro including a TSV, thereby obtaining the benefits discussed abovewith respect to memory macro structure 100.

FIG. 6 is a flowchart of a method 600 of manufacturing a memory macrostructure, in accordance with some embodiments. Method 600 is operableto form memory macro structure 100 discussed above with respect to FIGS.1A and 1B and/or IC package 400 discussed above with respect to FIG. 4 .In some embodiments, operations of method 600 are a subset of operationsof a method of forming an IC package, e.g., a 2.5D IC package, a 3D ICpackage, or an InFO package.

In some embodiments, the operations of method 600 are performed in theorder depicted in FIG. 6 . In some embodiments, the operations of method600 are performed in an order other than the order depicted in FIG. 6 .In some embodiments, one or more additional operations are performedbefore, during, and/or after the operations of method 600. In someembodiments, performing some or all of the operations of method 600includes performing one or more operations as discussed below withrespect to IC manufacturing system 1000 and FIG. 10 .

At operation 610, in some embodiments, a memory macro is built in asemiconductor wafer. In some embodiments, building the memory macroincludes building memory macro 100M die 100D discussed above withrespect to FIGS. 1A-4 .

Building the memory macro includes building a plurality of IC devices,e.g., transistors, logic gates, memory cells, interconnect structures,and/or other suitable devices, configured to operate as discussed abovewith respect to memory macro 100M.

Building the memory macro includes performing a plurality ofmanufacturing operations, e.g., one or more of a lithography, diffusion,deposition, etching, planarizing, or other operation suitable forbuilding the plurality of IC devices in the semiconductor wafer.

In some embodiments, building the memory macro includes building thememory macro including a dummy area, e.g., dummy area 200D discussedabove with respect to FIGS. 3A-3C. Building the memory macro includingthe dummy area includes forming one or more dielectric layers, therebyconfiguring the dummy area to be electrically isolated from the memorymacro, e.g., electrically isolated from global control circuit 200GCT,local control circuit 200LCT, or cell activation circuit 200WLDdiscussed above with respect to FIGS. 2-3C.

Forming one or more dielectric layers includes depositing one or moredielectric materials, e.g., silicon dioxide, silicon nitride, or one ormore high-k dielectric materials, or other materials capable ofelectrically insulating adjacent conductive segments from each other. Invarious embodiments, depositing a dielectric material includesperforming a physical vapor deposition (PVD) or chemical vapordeposition (CVD) process, a laser chemical vapor deposition (LCVD)process, an evaporation process, an electron beam evaporation (E-gun)process, or another suitable deposition process.

In some embodiments, operation 620 is performed prior to performingoperation 610, and building the memory macro includes forming the dummyarea adjacent to one or more TSVs extending through the memory macrostructure.

In some embodiments, building the memory macro in the semiconductorwafer includes building a plurality of memory macros, e.g., multipleinstances of memory macro 100M discussed above with respect to FIGS.1A-4 , in the semiconductor wafer.

In some embodiments, operation 610 is repeated such that building thememory macro in the semiconductor wafer includes building a plurality ofmemory macros in a corresponding plurality of semiconductor wafers,e.g., corresponding to memory dies 100D0-100D3 discussed above withrespect to FIG. 4 .

At operation 620, in some embodiments, a TSV spanning front and backsides of the semiconductor wafer and extending through the memory macrois constructed. Constructing the TSV includes performing a plurality ofmanufacturing operations including depositing and patterning one or morephotoresist layers, performing one or more etching processes, andperforming one or more deposition processes whereby one or moreconductive materials are configured to form a continuous, low resistancestructure spanning the front and back sides of the semiconductor wafer.

In some embodiments, constructing the TSV spanning the front and backsides of the semiconductor wafer and extending through the memory macroincludes constructing TSV 100T spanning front side FS and back side BSof IC die 100D and extending through memory macro 100M discussed abovewith respect to FIGS. 1A-4 .

In some embodiments, constructing the TSV extending through the memorymacro includes constructing the TSV extending through a dummy area ofthe memory macro, e.g., dummy area 200D discussed above with respect toFIGS. 3A-3C.

In some embodiments, operation 620 is performed prior to performingoperation 610, and constructing the TSV extending through the memorymacro includes constructing the TSV extending through one or moredielectric layers of the semiconductor wafer, the one or more dielectriclayers corresponding to the memory macro. In some embodiments, portionsof each of operations are performed iteratively, whereby the TSVspanning front and back sides of the semiconductor wafer and extendingthrough the memory macro is constructed.

In some embodiments, constructing the TSV spanning front and back sidesof the semiconductor wafer and extending through the memory macroincludes constructing a plurality of TSVs, e.g., multiple instances ofTSV 100T discussed above with respect to FIGS. 1A-4 .

In some embodiments, operation 610 is repeated such that constructingthe TSV spanning front and back sides of the semiconductor wafer andextending through the memory macro includes constructing a plurality ofTSVs spanning front and back sides of a corresponding plurality ofsemiconductor wafers and extending through corresponding memory macros,e.g., multiple instances of TSV 100T corresponding to memory dies100D0-100D3 discussed above with respect to FIG. 4 .

At operation 630, in some embodiments, the TSV is connected to a powerdistribution structure of an IC package, thereby electrically connectinga logic die to a substrate. Connecting the TSV to the power distributionstructure of the IC package includes performing one or more IC packagemanufacturing operations whereby a portion or all of the semiconductorwafer including the TSV extending through the memory macro is connectedto the power distribution structure of the IC package.

In various embodiments, the one or more IC package manufacturingoperations include one or more of a die separation process, a moldinginjection or deposition, a bonding process, a metal deposition process,a solder process, an annealing process, or another process suitable formanufacturing an IC package.

In some embodiments, connecting the TSV to the power distributionstructure of the IC package includes connecting an instance of TSV 100Tto power distribution structure 400PDS discussed above with respect toFIG. 4 .

In some embodiments, the TSV is one TSV of a plurality of TSVs, andconnecting the TSV to the power distribution structure of the IC packageincludes connecting each TSV of the plurality of TSVs the powerdistribution structure of the IC package, e.g., connecting multipleinstances of TSV 100T to power distribution structure 400PDS discussedabove with respect to FIG. 4 .

In some embodiments, operation 630 is repeated such that TSVs of aplurality of semiconductor wafers are connected to the powerdistribution structure, e.g., connecting TSVs of one or more of IC dies100D0-100D3 to power distribution structure 400PDS discussed above withrespect to FIG. 4 .

The operations of method 600 are capable of being performed as a wholeor as separate subsets of operations. For example, by performing some orall of operations 610 and 620, a memory macro structure including a TSVextending through, and electrically isolated from, the memory macro isformed, thereby obtaining the benefits discussed above with respect tomemory macro structure 100. By performing some or all of operation 630based on a memory macro structure formed in accordance with operations610 and 620, an IC package is formed in which the memory macro structureincludes a TSV extending through, and electrically isolated from, thememory macro, thereby obtaining the benefits discussed above withrespect to memory macro structure 100 and the with respect to IC package400.

FIG. 7 is a flowchart of a method 700 of generating an IC layoutdiagram, in accordance with some embodiments. In some embodiments,generating the IC layout diagram includes generating an IC layoutdiagram, e.g., an IC layout diagram 800A-800C discussed below withrespect to FIGS. 8A-8C, corresponding to a memory macro structure, e.g.,memory macro structure 100 discussed above with respect to FIGS. 1A-4 ,manufactured based on the generated IC layout diagram.

In some embodiments, some or all of method 700 is executed by aprocessor of a computer. In some embodiments, some or all of method 700is executed by a processor 902 of an IC layout diagram generation system900, discussed below with respect to FIG. 9 .

Some or all of the operations of method 700 are capable of beingperformed as part of a design procedure performed in a design house,e.g., a design house 1020 discussed below with respect to FIG. 10 .

In some embodiments, the operations of method 700 are performed in theorder depicted in FIG. 7 . In some embodiments, the operations of method700 are performed simultaneously and/or in an order other than the orderdepicted in FIG. 7 . In some embodiments, one or more operations areperformed before, between, during, and/or after performing one or moreoperations of method 700.

FIGS. 8A-8C depict non-limiting examples of respective IC layoutdiagrams 800A-800C generated by executing one or more operations ofmethod 700 as discussed below, in some embodiments. Each of IC layoutdiagrams 800A-800C is simplified for the purpose of illustration. Invarious embodiments, one or more of IC layout diagrams 800A-800Cincludes features in addition to those depicted in FIGS. 8A-8C, e.g.,one or more transistor elements, vias, contacts, isolation structures,wells, conductive elements, or the like. In addition to respective IClayout diagrams 800A-800C, each of FIGS. 8A-8C depicts the X and Ydirections discussed above with respect to FIGS. 1A-4 .

At operation 710, in some embodiments, a layout diagram of a memorymacro is modified to include a dummy region. Modifying the layoutdiagram of the memory macro to include the dummy region includes thedummy region being usable in a manufacturing process as part of defininga dummy area in a memory macro manufactured based on the layout diagramof the memory macro. In some embodiments, modifying the layout diagramof the memory macro to include the dummy region includes modifyingmemory macro 100M discussed above with respect to FIGS. 1A-4 .

In some embodiments, modifying the layout diagram of the memory macro toinclude the dummy region includes locating the dummy region in a controlcircuit region or a cell activation circuit region of the memory macro.In some embodiments, modifying the layout diagram of the memory macro toinclude the dummy region includes the dummy region being usable as partof defining an instance of dummy area 200D discussed above with respectto FIGS. 2-3C.

In some embodiments, modifying the layout diagram of the memory macro toinclude the dummy region includes modifying the layout diagram of thememory macro to include a plurality of dummy regions. In someembodiments, modifying the layout diagram of the memory macro to includethe dummy region includes modifying IC layout diagram 800A to includedummy regions 800DR as depicted in FIGS. 8A-8C. IC layout diagram 800Acorresponds to memory macro 100M and each of dummy regions 800DRcorresponds to an instance of dummy region 200D discussed above withrespect to FIGS. 1A-4 .

In some embodiments, modifying the layout diagram of the memory macroincludes receiving the memory macro from a storage device, e.g., anon-transitory, computer-readable storage medium 904 discussed belowwith respect to FIG. 9 . In some embodiments, modifying the layoutdiagram of the memory macro includes receiving the memory macro througha network interface, e.g., a network interface 912 discussed below withrespect to FIG. 9 .

In some embodiments, modifying the layout diagram of the memory macroincludes the memory macro being included in an intellectual property(IP) block. In some embodiments, modifying the layout diagram of thememory macro includes receiving the IP block, e.g., in the form of oneor more electronic files transmitted over a network.

In some embodiments, modifying the layout diagram of the memory macroincludes storing the memory macro in the storage device and/ortransmitting the memory macro through the network interface.

At operation 720, the layout diagram of the memory macro including thedummy region is received. In some embodiments, receiving the layoutdiagram of the memory macro includes receiving the layout diagram at anIC layout diagram generation system, e.g., IC layout diagram generationsystem 900 discussed below with respect to FIG. 9 .

In some embodiments, receiving the layout diagram of the memory macroincludes receiving IC layout diagram 800A.

In some embodiments, receiving the layout diagram of the memory macroincludes receiving a plurality of layout diagrams of memory macros. Invarious embodiments, receiving the plurality of layout diagrams ofmemory macros includes the layout diagrams being the same or varyinglayout diagrams.

At operation 730, the layout diagram of the memory macro is placed in alayout diagram of an IC die. In some embodiments, placing the layoutdiagram of the memory macro in the layout diagram of the IC die includesthe layout diagram of the IC die corresponding to IC die 100D discussedabove with respect to FIGS. 1A-4 .

In some embodiments, the layout diagram is one layout diagram of aplurality of layout diagrams of memory macros, and placing the layoutdiagram of the memory macro in the layout diagram of the IC die includesplacing the plurality of layout diagrams of memory macros in the layoutdiagram of the IC die. In some embodiments, placing the plurality oflayout diagrams of memory macros in the layout diagram of the IC dieincludes arranging the plurality of layout diagrams of memory macros inrows and/or columns.

In some embodiments, placing the layout diagram of the memory macro inthe layout diagram of the IC die includes placing IC layout diagram 800Ain one of IC layout diagram 800B depicted in FIG. 8B or IC layoutdiagram 800C depicted in FIG. 8C.

At operation 740, a plurality of TSV regions is arranged in the layoutdiagram of the IC die by placing a first TSV region of the plurality ofTSV regions in the dummy region. In some embodiments, placing the firstTSV region of the plurality of TSV regions in the dummy region includesplacing the first TSV region corresponding to an instance of TSV 100Tdiscussed above with respect to FIGS. 1A-4 .

In some embodiments, the dummy region is a first dummy region of aplurality of dummy regions of the memory macro, and arranging theplurality of TSV regions in the layout diagram of the IC die includesplacing a second TSV region of the plurality of TSV regions in a seconddummy region of the plurality of dummy regions.

In some embodiments, the layout diagram of the memory macro is onelayout diagram of a plurality of layout diagrams of memory macros, andarranging the plurality of TSV regions in the layout diagram of the ICdie includes placing a TSV region of the plurality of TSV regions ineach dummy region of a corresponding memory macro of the plurality oflayout diagrams of memory macros.

In some embodiments, the layout diagram of the memory macro is onelayout diagram of a plurality of layout diagrams of memory macrosarranged in rows, and arranging the plurality of TSV regions in thelayout diagram of the IC die includes placing a subset of the pluralityof TSV regions between adjacent rows of the plurality of layout diagramsof memory macros.

In some embodiments, arranging the plurality of TSV regions in thelayout diagram of the IC die includes arranging TSV regions 800TSV inone of IC layout diagram 800B depicted in FIG. 8B or IC layout diagram800C depicted in FIG. 8C. Each of TSV regions 800TSV is a region in anIC layout diagram usable in the manufacturing process as part ofdefining a TSV, e.g., TSV 100T discussed above with respect to FIGS.1A-4 .

In the non-limiting example depicted in FIG. 8B, arranging TSV regions800TSV includes placing an instance of TSV region 800TSV in eachinstance of dummy region 800DR of each instance of IC layout diagram800A. In the non-limiting example depicted in FIG. 8C, arranging TSVregions 800TSV includes placing an instance of TSV region 800TSV in asingle instance of dummy region 800DR of each instance of IC layoutdiagram 800A. In various embodiments, arranging TSV regions 800TSVincludes otherwise placing instances of TSV region 800TSV in instancesof dummy region 800DR of instances of IC layout diagram 800A, e.g.,placing varying numbers of instances of TSV regions in instances ofdummy region 800DR for a given instance of IC layout diagram 800A.

In some embodiments, arranging the plurality of TSV regions in thelayout diagram of the IC die is based on one or more design criteria ofa logic die, e.g., logic die 400L discussed above with respect to FIG. 4. In some embodiments, the one or more design criteria include powersupply voltage drops based on resistance values of a plurality of TSVscorresponding to the plurality of TSV regions.

At operation 750, in some embodiments, the IC layout diagram isgenerated and stored in a storage device. Generating the IC layoutdiagram is performed by a processor, e.g., processor 902 of IC layoutdiagram generation system 900 discussed below with respect to FIG. 9 .

In some embodiments, generating the IC layout diagram includespositioning one or more features (not shown), e.g., a contact, via, orconductive region, corresponding to one or more IC structuresmanufactured based on the one or more features and configured to provideelectrical connections to one or more memory macros corresponding to thememory macro including the dummy region.

In various embodiments, storing the IC layout diagram in the storagedevice includes storing the IC layout diagram in a non-volatile,computer-readable memory, e.g., a database, and/or includes storing theIC layout diagram over a network. In various embodiments, storing the IClayout diagram in the storage device includes storing the IC layoutdiagram in non-volatile, computer-readable memory 904 and/or overnetwork 914 of IC layout diagram generation system 900, discussed belowwith respect to FIG. 9 .

In various embodiments, generating and storing the IC layout diagramincludes generating and storing one or more of IC layout diagrams800A-800C.

At operation 760, in some embodiments, at least one of one or moresemiconductor masks, or at least one component in a layer of asemiconductor IC is fabricated based on the IC layout diagram.Fabricating one or more semiconductor masks or at least one component ina layer of a semiconductor IC is discussed below with respect to ICmanufacturing system 1000 and FIG. 10 .

In various embodiments, fabricating one or more semiconductor masks orat least one component in the layer of the semiconductor IC is based onone or more of IC layout diagrams 800A-800C.

At operation 770, in some embodiments, one or more manufacturingoperations are performed based on the IC layout diagram. In someembodiments, performing one or more manufacturing operations includesperforming one or more lithographic exposures based on the IC layoutdiagram. Performing one or more manufacturing operations, e.g., one ormore lithographic exposures, based on the IC layout diagram is discussedbelow with respect to FIG. 10 .

In various embodiments, performing one or more manufacturing operationsis based on one or more of IC layout diagrams 800A-800C.

By executing some or all of the operations of method 700, an IC layoutdiagram, e.g., IC layout diagram 800A-800C, is generated correspondingto a memory macro structure in which a TSV extends through the memorymacro structure, thereby realizing the benefits discussed above withrespect to memory macro structure 100. Further, by placing a layoutdiagram of a memory macro and separately arranging a plurality of TSVregions, design flexibility is improved over approaches in whicharranging a plurality of TSV regions is not separate from placing alayout diagram of a memory macro.

FIG. 9 is a block diagram of IC layout diagram generation system 900, inaccordance with some embodiments. Methods described herein of designingIC layout diagrams in accordance with one or more embodiments areimplementable, for example, using IC layout diagram generation system900, in accordance with some embodiments.

In some embodiments, IC layout diagram generation system 900 is ageneral purpose computing device including a hardware processor 902 andnon-transitory, computer-readable storage medium 904. Storage medium904, amongst other things, is encoded with, i.e., stores, computerprogram code 906, i.e., a set of executable instructions. Execution ofinstructions 906 by hardware processor 902 represents (at least in part)an EDA tool which implements a portion or all of a method, e.g., method700 of generating an IC layout diagram described above (hereinafter, thenoted processes and/or methods).

Processor 902 is electrically coupled to computer-readable storagemedium 904 via a bus 908. Processor 902 is also electrically coupled toan I/O interface 910 by bus 908. Network interface 912 is alsoelectrically connected to processor 902 via bus 908. Network interface912 is connected to a network 914, so that processor 902 andcomputer-readable storage medium 904 are capable of connecting toexternal elements via network 914. Processor 902 is configured toexecute computer program code 906 encoded in computer-readable storagemedium 904 in order to cause IC layout diagram generation system 900 tobe usable for performing a portion or all of the noted processes and/ormethods. In one or more embodiments, processor 902 is a centralprocessing unit (CPU), a multi-processor, a distributed processingsystem, an application specific integrated circuit (ASIC), and/or asuitable processing unit.

In one or more embodiments, computer-readable storage medium 904 is anelectronic, magnetic, optical, electromagnetic, infrared, and/or asemiconductor system (or apparatus or device). For example,computer-readable storage medium 904 includes a semiconductor orsolid-state memory, a magnetic tape, a removable computer diskette, arandom access memory (RAM), a read-only memory (ROM), a rigid magneticdisk, and/or an optical disk. In one or more embodiments using opticaldisks, computer-readable storage medium 904 includes a compact disk-readonly memory (CD-ROM), a compact disk-read/write (CD-R/W), and/or adigital video disc (DVD).

In one or more embodiments, storage medium 904 stores computer programcode 906 configured to cause IC layout diagram generation system 900(where such execution represents (at least in part) the EDA tool) to beusable for performing a portion or all of the noted processes and/ormethods. In one or more embodiments, storage medium 904 also storesinformation which facilitates performing a portion or all of the notedprocesses and/or methods. In one or more embodiments, storage medium 904stores IC die library 907 of IC dies including IC layout diagram 800Aand/or 800B discussed above with respect to FIGS. 8A-8C.

IC layout diagram generation system 900 includes I/O interface 910. I/Ointerface 910 is coupled to external circuitry. In one or moreembodiments, I/O interface 910 includes a keyboard, keypad, mouse,trackball, trackpad, touchscreen, and/or cursor direction keys forcommunicating information and commands to processor 902.

IC layout diagram generation system 900 also includes network interface912 coupled to processor 902. Network interface 912 allows system 900 tocommunicate with network 914, to which one or more other computersystems are connected. Network interface 912 includes wireless networkinterfaces such as BLUETOOTH, WIFI, WIMAX, GPRS, or WCDMA; or wirednetwork interfaces such as ETHERNET, USB, or IEEE-1364. In one or moreembodiments, a portion or all of noted processes and/or methods, isimplemented in two or more IC layout diagram generation systems 900.

IC layout diagram generation system 900 is configured to receiveinformation through I/O interface 910. The information received throughI/O interface 910 includes one or more of instructions, data, designrules, libraries of standard cells, and/or other parameters forprocessing by processor 902. The information is transferred to processor902 via bus 908. IC layout diagram generation system 900 is configuredto receive information related to a UI through I/O interface 910. Theinformation is stored in computer-readable medium 904 as user interface(UI) 942.

In some embodiments, a portion or all of the noted processes and/ormethods is implemented as a standalone software application forexecution by a processor. In some embodiments, a portion or all of thenoted processes and/or methods is implemented as a software applicationthat is a part of an additional software application. In someembodiments, a portion or all of the noted processes and/or methods isimplemented as a plug-in to a software application. In some embodiments,at least one of the noted processes and/or methods is implemented as asoftware application that is a portion of an EDA tool. In someembodiments, a portion or all of the noted processes and/or methods isimplemented as a software application that is used by IC layout diagramgeneration system 900. In some embodiments, a layout diagram whichincludes standard cells is generated using a tool such as VIRTUOSO®available from CADENCE DESIGN SYSTEMS, Inc., or another suitable layoutgenerating tool.

In some embodiments, the processes are realized as functions of aprogram stored in a non-transitory computer readable recording medium.Examples of a non-transitory computer readable recording medium include,but are not limited to, external/removable and/or internal/built-instorage or memory unit, e.g., one or more of an optical disk, such as aDVD, a magnetic disk, such as a hard disk, a semiconductor memory, suchas a ROM, a RAM, a memory card, and the like.

FIG. 10 is a block diagram of IC manufacturing system 1000, and an ICmanufacturing flow associated therewith, in accordance with someembodiments. In some embodiments, based on an IC layout diagram, atleast one of (A) one or more semiconductor masks or (B) at least onecomponent in a layer of a semiconductor integrated circuit is fabricatedusing manufacturing system 1000.

In FIG. 10 , IC manufacturing system 1000 includes entities, such as adesign house 1020, a mask house 1030, and an IC manufacturer/fabricator(“fab”) 1050, that interact with one another in the design, development,and manufacturing cycles and/or services related to manufacturing an ICdevice 1060. The entities in system 1000 are connected by acommunications network. In some embodiments, the communications networkis a single network. In some embodiments, the communications network isa variety of different networks, such as an intranet and the Internet.The communications network includes wired and/or wireless communicationchannels. Each entity interacts with one or more of the other entitiesand provides services to and/or receives services from one or more ofthe other entities. In some embodiments, two or more of design house1020, mask house 1030, and IC fab 1050 is owned by a single largercompany. In some embodiments, two or more of design house 1020, maskhouse 1030, and IC fab 1050 coexist in a common facility and use commonresources.

Design house (or design team) 1020 generates an IC design layout diagram1022. IC design layout diagram 1022 includes various geometricalpatterns, e.g., an IC layout diagram discussed above. The geometricalpatterns correspond to patterns of metal, oxide, or semiconductor layersthat make up the various components of IC device 1060 to be fabricated.The various layers combine to form various IC features. For example, aportion of IC design layout diagram 1022 includes various IC features,such as an active region, gate electrode, source and drain, metal linesor vias of an interlayer interconnection, and openings for bonding pads,to be formed in a semiconductor substrate (such as a silicon wafer) andvarious material layers disposed on the semiconductor substrate. Designhouse 1020 implements a proper design procedure to form IC design layoutdiagram 1022. The design procedure includes one or more of logic design,physical design or place and route. IC design layout diagram 1022 ispresented in one or more data files having information of thegeometrical patterns. For example, IC design layout diagram 1022 can beexpressed in a GDSII file format or DFII file format.

Mask house 1030 includes data preparation 1032 and mask fabrication1044. Mask house 1030 uses IC design layout diagram 1022 to manufactureone or more masks 1045 to be used for fabricating the various layers ofIC device 1060 according to IC design layout diagram 1022. Mask house1030 performs mask data preparation 1032, where IC design layout diagram1022 is translated into a representative data file (“RDF”). Mask datapreparation 1032 provides the RDF to mask fabrication 1044. Maskfabrication 1044 includes a mask writer. A mask writer converts the RDFto an image on a substrate, such as a mask (reticle) 1045 or asemiconductor wafer 1053. The design layout diagram 1022 is manipulatedby mask data preparation 1032 to comply with particular characteristicsof the mask writer and/or requirements of IC fab 1050. In FIG. 10 , maskdata preparation 1032 and mask fabrication 1044 are illustrated asseparate elements. In some embodiments, mask data preparation 1032 andmask fabrication 1044 can be collectively referred to as mask datapreparation.

In some embodiments, mask data preparation 1032 includes opticalproximity correction (OPC) which uses lithography enhancement techniquesto compensate for image errors, such as those that can arise fromdiffraction, interference, other process effects and the like. OPCadjusts IC design layout diagram 1022. In some embodiments, mask datapreparation 1032 includes further resolution enhancement techniques(RET), such as off-axis illumination, sub-resolution assist features,phase-shifting masks, other suitable techniques, and the like orcombinations thereof. In some embodiments, inverse lithographytechnology (ILT) is also used, which treats OPC as an inverse imagingproblem.

In some embodiments, mask data preparation 1032 includes a mask rulechecker (MRC) that checks the IC design layout diagram 1022 that hasundergone processes in OPC with a set of mask creation rules whichcontain certain geometric and/or connectivity restrictions to ensuresufficient margins, to account for variability in semiconductormanufacturing processes, and the like. In some embodiments, the MRCmodifies the IC design layout diagram 1022 to compensate for limitationsduring mask fabrication 1044, which may undo part of the modificationsperformed by OPC in order to meet mask creation rules.

In some embodiments, mask data preparation 1032 includes lithographyprocess checking (LPC) that simulates processing that will beimplemented by IC fab 1050 to fabricate IC device 1060. LPC simulatesthis processing based on IC design layout diagram 1022 to create asimulated manufactured device, such as IC device 1060. The processingparameters in LPC simulation can include parameters associated withvarious processes of the IC manufacturing cycle, parameters associatedwith tools used for manufacturing the IC, and/or other aspects of themanufacturing process. LPC takes into account various factors, such asaerial image contrast, depth of focus (“DOF”), mask error enhancementfactor (“MEEF”), other suitable factors, and the like or combinationsthereof. In some embodiments, after a simulated manufactured device hasbeen created by LPC, if the simulated device is not close enough inshape to satisfy design rules, OPC and/or MRC are be repeated to furtherrefine IC design layout diagram 1022.

It should be understood that the above description of mask datapreparation 1032 has been simplified for the purposes of clarity. Insome embodiments, data preparation 1032 includes additional featuressuch as a logic operation (LOP) to modify the IC design layout diagram1022 according to manufacturing rules. Additionally, the processesapplied to IC design layout diagram 1022 during data preparation 1032may be executed in a variety of different orders.

After mask data preparation 1032 and during mask fabrication 1044, amask 1045 or a group of masks 1045 are fabricated based on the modifiedIC design layout diagram 1022. In some embodiments, mask fabrication1044 includes performing one or more lithographic exposures based on ICdesign layout diagram 1022. In some embodiments, an electron-beam(e-beam) or a mechanism of multiple e-beams is used to form a pattern ona mask (photomask or reticle) 1045 based on the modified IC designlayout diagram 1022. Mask 1045 can be formed in various technologies. Insome embodiments, mask 1045 is formed using binary technology. In someembodiments, a mask pattern includes opaque regions and transparentregions. A radiation beam, such as an ultraviolet (UV) or EUV beam, usedto expose the image sensitive material layer (e.g., photoresist) whichhas been coated on a wafer, is blocked by the opaque region andtransmits through the transparent regions. In one example, a binary maskversion of mask 1045 includes a transparent substrate (e.g., fusedquartz) and an opaque material (e.g., chromium) coated in the opaqueregions of the binary mask. In another example, mask 1045 is formedusing a phase shift technology. In a phase shift mask (PSM) version ofmask 1045, various features in the pattern formed on the phase shiftmask are configured to have proper phase difference to enhance theresolution and imaging quality. In various examples, the phase shiftmask can be attenuated PSM or alternating PSM. The mask(s) generated bymask fabrication 1044 is used in a variety of processes. For example,such a mask(s) is used in an ion implantation process to form variousdoped regions in semiconductor wafer 1053, in an etching process to formvarious etching regions in semiconductor wafer 1053, and/or in othersuitable processes.

IC fab 1050 is an IC fabrication business that includes one or moremanufacturing facilities for the fabrication of a variety of differentIC products. In some embodiments, IC Fab 1050 is a semiconductorfoundry. For example, there may be a manufacturing facility for thefront end fabrication of a plurality of IC products (front-end-of-line(FEOL) fabrication), while a second manufacturing facility may providethe back end fabrication for the interconnection and packaging of the ICproducts (back-end-of-line (BEOL) fabrication), and a thirdmanufacturing facility may provide other services for the foundrybusiness.

IC fab 1050 includes wafer fabrication tools 1052 configured to executevarious manufacturing operations on semiconductor wafer 1053 such thatIC device 1060 is fabricated in accordance with the mask(s), e.g., mask1045. In various embodiments, fabrication tools 1052 include one or moreof a wafer stepper, an ion implanter, a photoresist coater, a processchamber, e.g., a CVD chamber or LPCVD furnace, a CMP system, a plasmaetch system, a wafer cleaning system, or other manufacturing equipmentcapable of performing one or more suitable manufacturing processes asdiscussed herein.

IC fab 1050 uses mask(s) 1045 fabricated by mask house 1030 to fabricateIC device 1060. Thus, IC fab 1050 at least indirectly uses IC designlayout diagram 1022 to fabricate IC device 1060. In some embodiments,semiconductor wafer 1053 is fabricated by IC fab 1050 using mask(s) 1045to form IC device 1060. In some embodiments, the IC fabrication includesperforming one or more lithographic exposures based at least indirectlyon IC design layout diagram 1022. Semiconductor wafer 1053 includes asilicon substrate or other proper substrate having material layersformed thereon. Semiconductor wafer 1053 further includes one or more ofvarious doped regions, dielectric features, multilevel interconnects,and the like (formed at subsequent manufacturing steps).

Details regarding an IC manufacturing system (e.g., system 1000 of FIG.10 ), and an IC manufacturing flow associated therewith are found, e.g.,in U.S. Pat. No. 9,256,709, granted Feb. 9, 2016, U.S. Pre-GrantPublication No. 20150278429, published Oct. 1, 2015, U.S. Pre-GrantPublication No. 20140040838, published Feb. 6, 2014, and U.S. Pat. No.7,260,442, granted Aug. 21, 2007, the entireties of each of which arehereby incorporated by reference.

In some embodiments, a memory macro structure includes a first memoryarray, a second memory array, a cell activation circuit coupled to thefirst and second memory arrays and positioned between the first andsecond memory arrays, a control circuit coupled to the cell activationcircuit and positioned adjacent to the cell activation circuit, and aTSV extending through one of the cell activation circuit or the controlcircuit. In some embodiments, the cell activation circuit includes afirst portion coupled to the first memory array and a second portioncoupled to the second memory array, the TSV extends though the cellactivation circuit between the first portion and the second portion, andthe control circuit is configured to communicate a first set ofpre-decode signals to the first portion and a second set of pre-decodesignals to the second portion. In some embodiments, the first and secondportions are separated by a dummy area, and the TSV extends through thedummy area. In some embodiments, the TSV extends though the controlcircuit, and the control circuit is configured to communicate a singleset of pre-decode signals to the cell activation circuit. In someembodiments, the TSV is a first TSV, the control circuit is a localcontrol circuit, the memory macro structure includes a global controlcircuit coupled to the local control circuit, and a second TSV extendsthrough the global control circuit. In some embodiments, the cellactivation circuit is a first cell activation circuit, the TSV is afirst TSV extending through the first cell activation circuit, and thememory macro structure includes a second cell activation circuit and asecond TSV extending through the second cell activation circuit. In someembodiments, the control circuit is a first local control circuit, theTSV is a first TSV extending through the first local control circuit,and the memory macro structure includes a second local control circuitand a second TSV extending through the second local control circuit. Insome embodiments, the memory macro structure is one memory macrostructure of a plurality of memory macro structures, each memory macrostructure of the plurality of memory macro structures includes acorresponding cell activation circuit and a corresponding controlcircuit, the TSV is one TSV of a plurality of TSVs, and each TSV of theplurality of TSVs extends through the corresponding one of the cellactivation circuit or the control circuit of a corresponding memorymacro structure of the plurality of memory macro structures.

In some embodiments, an IC package includes a logic die, a substrate,and a memory die positioned between the logic die and the substrate. Thememory die includes a plurality of memory macros and a plurality of TSVsspanning front and back sides of the memory die and electrically coupledto the logic die and the substrate and a TSV of the plurality of TSVsextends through, and is electrically isolated from, a memory macro ofthe plurality of memory macros. In some embodiments, the TSV extendsthrough one of a cell activation circuit or a control circuit of thememory macro. In some embodiments, the TSV is one TSV of a first subsetof the plurality of TSVs, each TSV of the first subset of the pluralityof TSVs extends through a corresponding memory macro of the plurality ofmemory macros, and each TSV of a second subset of the plurality of TSVsextends through the memory die outside of each memory macro of theplurality of memory macros. In some embodiments, a pitch of theplurality of memory macros is twice as large as a pitch of the pluralityof TSVs. In some embodiments, the memory die is one memory die of aplurality of memory dies positioned between the logic die and thesubstrate, and each memory die of the plurality of memory dies includesa corresponding plurality of memory macros and a corresponding pluralityof TSVs spanning front and back sides of the corresponding memory dieand electrically coupled to the logic die and the substrate, wherein acorresponding TSV of the plurality of TSVs extends through acorresponding memory macro of the plurality of memory macros. In someembodiments, the logic die, the plurality of memory dies, and thesubstrate are aligned along a single direction. In some embodiments,each memory macro of the plurality of memory macros includes an array ofSRAM cells.

In some embodiments, a method of manufacturing a memory macro structureincludes building a memory macro in a semiconductor wafer, the memorymacro including a cell activation circuit and a control circuit, andconstructing a TSV spanning front and back sides of the semiconductorwafer and extending through one of the cell activation circuit or thecontrol circuit. In some embodiments, building the memory macro includesforming a dummy area including one or more dielectric layers in the oneof the cell activation circuit or the control circuit, and constructingthe TSV includes constructing the TSV extending through the dummy area.In some embodiments, the memory macro is a first memory macro, the TSVis a first TSV, building the memory macro includes building a secondmemory macro adjacent to the first memory macro, and constructing theTSV includes constructing a second TSV extending between the first andsecond memory macros. In some embodiments, the TSV is a first TSV, andconstructing the TSV includes constructing a second TSV extendingthrough the other of the cell activation circuit or the control circuit.In some embodiments, the method includes connecting the TSV to a powerdistribution structure of an IC package.

The foregoing outlines features of several embodiments so that thoseskilled in the art may better understand the aspects of the presentdisclosure. Those skilled in the art should appreciate that they mayreadily use the present disclosure as a basis for designing or modifyingother processes and structures for carrying out the same purposes and/orachieving the same advantages of the embodiments introduced herein.Those skilled in the art should also realize that such equivalentconstructions do not depart from the spirit and scope of the presentdisclosure, and that they may make various changes, substitutions, andalterations herein without departing from the spirit and scope of thepresent disclosure.

What is claimed is:
 1. A memory macro structure positioned in anintegrated circuit (IC) die, the memory macro structure comprising: afirst memory array; a second memory array; a cell activation circuitcoupled to the first and second memory arrays and positioned between thefirst and second memory arrays; a control circuit coupled to the cellactivation circuit and positioned adjacent to the cell activationcircuit; and a through-silicon via (TSV) spanning front and backs sidesof the IC die and extending through one of the cell activation circuitor the control circuit.
 2. The memory macro structure of claim 1,wherein the cell activation circuit comprises a first portion coupled tothe first memory array and a second portion coupled to the second memoryarray, the TSV extends through the cell activation circuit between thefirst portion and the second portion, and the control circuit isconfigured to communicate a first set of pre-decode signals to the firstportion and a second set of pre-decode signals to the second portion. 3.The memory macro structure of claim 2, wherein the first and secondportions are separated by a dummy area, and the TSV extends through thedummy area.
 4. The memory macro structure of claim 1, wherein the TSVextends through the control circuit, and the control circuit isconfigured to communicate a single set of pre-decode signals to the cellactivation circuit.
 5. The memory macro structure of claim 4, whereinthe TSV is a first TSV, the control circuit is a local control circuit,the memory macro structure comprises a global control circuit coupled tothe local control circuit, and a second TSV extends through the globalcontrol circuit.
 6. The memory macro structure of claim 1, wherein thecell activation circuit is a first cell activation circuit, the TSV is afirst TSV extending through the first cell activation circuit, and thememory macro structure comprises a second cell activation circuit and asecond TSV extending through the second cell activation circuit.
 7. Thememory macro structure of claim 1, wherein the control circuit is afirst local control circuit, the TSV is a first TSV extending throughthe first local control circuit, and the memory macro structurecomprises a second local control circuit and a second TSV extendingthrough the second local control circuit.
 8. The memory macro structureof claim 1, wherein the memory macro structure is one memory macrostructure of a plurality of memory macro structures positioned in the ICdie, each memory macro structure of the plurality of memory macrostructures comprises a corresponding cell activation circuit and acorresponding control circuit, the TSV is one TSV of a plurality ofTSVs, and each TSV of the plurality of TSVs extends through thecorresponding one of the cell activation circuit or the control circuitof a corresponding memory macro structure of the plurality of memorymacro structures.
 9. An integrated circuit (IC) package comprising: alogic die; a substrate; and a memory die positioned between the logicdie and the substrate, wherein the memory die comprises: a plurality ofmemory macros; and a plurality of through-silicon vias (TSVs) spanningfront and back sides of the memory die and electrically coupled to thelogic die and the substrate, wherein a TSV of the plurality of TSVsextends through, and is electrically isolated from, a memory macro ofthe plurality of memory macros.
 10. The IC package of claim 9, whereinthe TSV extends through one of a cell activation circuit or a controlcircuit of the memory macro.
 11. The IC package of claim 9, wherein theTSV is one TSV of a first subset of the plurality of TSVs, each TSV ofthe first subset of the plurality of TSVs extends through acorresponding memory macro of the plurality of memory macros, and eachTSV of a second subset of the plurality of TSVs extends through thememory die outside of each memory macro of the plurality of memorymacros.
 12. The IC package of claim 9, wherein a pitch of the pluralityof memory macros is twice as large as a pitch of the plurality of TSVs.13. The IC package of claim 9, wherein the memory die is one memory dieof a plurality of memory dies positioned between the logic die and thesubstrate, and each memory die of the plurality of memory diescomprises: a corresponding plurality of memory macros; and acorresponding plurality of TSVs spanning front and back sides of thecorresponding memory die and electrically coupled to the logic die andthe substrate, wherein a corresponding TSV of the plurality of TSVsextends through a corresponding memory macro of the plurality of memorymacros.
 14. The IC package of claim 13, wherein the logic die, theplurality of memory dies, and the substrate are aligned along a singledirection.
 15. The IC package of claim 9, wherein each memory macro ofthe plurality of memory macros comprises an array of staticrandom-access memory (SRAM) cells.
 16. A method of manufacturing amemory macro structure, the method comprising: building a memory macroin a semiconductor wafer, the memory macro comprising a cell activationcircuit and a control circuit; and constructing a through-silicon via(TSV) spanning front and back sides of the semiconductor wafer andextending through one of the cell activation circuit or the controlcircuit.
 17. The method of claim 16, wherein the building the memorymacro comprises forming a dummy area comprising one or more dielectriclayers in the one of the cell activation circuit or the control circuit,and the constructing the TSV comprises constructing the TSV extendingthrough the dummy area.
 18. The method of claim 16, wherein the memorymacro is a first memory macro, the TSV is a first TSV, the building thememory macro comprises building a second memory macro adjacent to thefirst memory macro, and the constructing the TSV comprises constructinga second TSV extending between the first and second memory macros. 19.The method of claim 16, wherein the TSV is a first TSV, and theconstructing the TSV comprises constructing a second TSV extendingthrough the other of the cell activation circuit or the control circuit.20. The method of claim 16, further comprising: connecting the TSV to apower distribution structure of an integrated circuit (IC) package.